L. Ronchi Abbozzo, Fondazione Giorgio Ronchi, Firenze, Italy
ronchi@infinito.it

X.  Maldague, Electrical and Computing Engineering Dept., Quebec City, Canada
maldagx@gel.ulaval.ca

P. Bison, CNR-ITC, Pandova, Italy
paolo.bison@itc.cnr.it

M. D'Acunto, CNR-ISM, Rome, Italy
mario.dacunto@ism.cnr.it

D. Moroni, CNR-ISTI, Pisa, Italy
davide.moroni@isti.cnr.it

V. Raimondi, CNR-IFAC, Firenze, Italy
v.raimondi@ifac.cnr.it

A. Rogalski, Military University of Technology, Warsaw, Poland
rogan@wat.edu.pl

T. Sakagami, Kobe University, Kobe, Japan
sakagami@mech.kobe-u.ac.jp

M. Strojnik, CIO, León, Guanajuato, Mexico
marias@cio.mx

D. Balageas, Onera, Chatillon, France
balageas@onera.fr

C. Corsi, Alenia-Creo, L'Aquila, Italy
corsi@romaricerche.it

E Derekiak, University of Arizona, Tucson, USA
eustace@optics.arizona.edu

C.T. Elliott, Heriot-Watt University, Edinburgh, Scotland
C.T.Elliott@hw.ac.uk

C. Maierhofer, BAM, Germany
christiane.maierhofer@bam.de

C. Meola, Univ. of Naples, Naples, Italy
carmeola@unina.it

I. Pippi, CNR-IFAC, Firenze, Italy
pippi@ifac.cnr.it

H.N. Rutt, Southampton University, Southampton, United Kingdom
hnr@ecs.soton.ac.uk

O. Salvetti, CNR-ISTI, Pisa, Italy
Ovidio.Salvetti@isti.cnr.it

J.L. Tissot, ULIS, Veurey Voroize, France
jl.tissot@ulis-ir.com

V.P. Vavilov, Tomsk University, Tomsk, Russia
vavilov@introscopy.tpu.ru

H. Zogg, ETH, Zurich, Switzerland
zogg@phys.ethz.ch